Faults in digital circuits
In considering the techniques that may be used for digital circuit testing, two distinct philosophies may be found, namely: (a) to undertake a series of functional tests and check for the correct (fault free) 0 or 1 output response(s); (b) to consider the possible faults that may occur within the circuit, and then to apply a series of tests which are specifically formulated to check whether each of these faults is present or not.
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