This chapter is a broad overview of the problems of testing circuits of VLSI complexity and systems into which they may be assembled. As will be appreciated, the testing problem is not usually one of fundamental technical difficulty, but much more one of the time and/or the cost necessary to undertake a procedure which would guarantee 100% correct functionality. The subsequent chapters of this text will therefore consider the types of failures which may be encountered in microelectronic circuits, fault models for digital circuits, the problems of observability and controllability and the various techniques that are available to ease the testing of both digital and mixed analogue/digital circuits. Finally, the financial aspects of testing which reflect back upon the initial design of the circuit or system will be considered, as well as the production quantities that may be involved. We will conclude this chapter with a list of publications which may be relevant for further general or specific reading. The more specialised ones may be referenced again in the following chapters.
Introduction, Page 1 of 2
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