This chapter describes test strategies, including a concise introduction to DSP testing, for analog and mixed-signal circuits. The main emphasis will be on integrated circuits. Although design-for-testability and design-for diagnosibility are only briefly reviewed, two self-test schemes for mixed-signal ICs are presented in more detail describing the necessary components along with implementations for the on-chip generation of test stimuli . Some prerequisites for automatic fault simulation of analog circuits are dealt with. Fault models for analog circuits are discussed and the local layout realistic faults mapping scheme which allows more realistic fault models to be obtained prior to the final layout is introduced. Appropriate simulation fault models are discussed along with a brief description of the automatic fault simulation tool AnaFAULT and the fault extraction tool LIFT.

Inspec keywords: analogue integrated circuits; design for testability; automatic test software; fault simulation; mixed analogue-digital integrated circuits; integrated circuit testing

Other keywords: LIFT fault extraction tool; on-chip generation; AnaFAULT automatic fault simulation tool; local layout realistic faults mapping; analog integrated circuit test; mixed-signal circuits; design-for-testability; design-for diagnosibility; fault modelling; DSP testing

Subjects: Analogue circuit design, modelling and testing