http://iet.metastore.ingenta.com
1887

Dynamic reliability of systems

Dynamic reliability of systems

For access to this article, please select a purchase option:

Buy chapter PDF
£10.00
(plus tax if applicable)
Buy Knowledge Pack
10 chapters for £75.00
(plus taxes if applicable)

IET members benefit from discounts to all IET publications and free access to E&T Magazine. If you are an IET member, log in to your account and the discounts will automatically be applied.

Learn more about IET membership 

Recommend to library

You must fill out fields marked with: *

Librarian details
Name:*
Email:*
Your details
Name:*
Email:*
Department:*
Why are you recommending this title?
Select reason:
 
 
 
 
 
Low-power HF Microelectronics: a unified approach — Recommend this title to your library

Thank you

Your recommendation has been sent to your librarian.

This chapter presents an investigation of design and manufacturing practices on the reliability of electronic devices, circuits and systems, with a strong focus on monitoring techniques to estimate the impact of these practices. Reliability models of these devices and systems have generally relied heavily on statistical data collected over a long period of time and codified into standards by various governments, technical agencies and companies. While new approaches to reliability analysis and modelling are emerging, some standards are still widely applicable. However, they barely cover new generations of devices designed and manufactured with new techniques such as ASIC designs, quick prototyping using array technologies, ever-changing semiconductor manufacturing methods, new packaging procedures, etc.

Inspec keywords: application specific integrated circuits; integrated circuit design; integrated circuit reliability

Other keywords: dynamic reliability; array technology; quick prototyping; semiconductor manufacturing; electronic device manufacturing; ASIC designs; reliability analysis

Subjects: Semiconductor integrated circuit design, layout, modelling and testing

Preview this chapter:
Zoom in
Zoomout

Dynamic reliability of systems, Page 1 of 2

| /docserver/preview/fulltext/books/cs/pbcs008e/PBCS008E_ch12-1.gif /docserver/preview/fulltext/books/cs/pbcs008e/PBCS008E_ch12-2.gif

Related content

content/books/10.1049/pbcs008e_ch12
pub_keyword,iet_inspecKeyword,pub_concept
6
6
Loading
This is a required field
Please enter a valid email address