Your browser does not support JavaScript!
http://iet.metastore.ingenta.com
1887

Robust design and reliability analysis

Robust design and reliability analysis

For access to this article, please select a purchase option:

Buy chapter PDF
£10.00
(plus tax if applicable)
Buy Knowledge Pack
10 chapters for £75.00
(plus taxes if applicable)

IET members benefit from discounts to all IET publications and free access to E&T Magazine. If you are an IET member, log in to your account and the discounts will automatically be applied.

Learn more about IET membership 

Recommend Title Publication to library

You must fill out fields marked with: *

Librarian details
Name:*
Email:*
Your details
Name:*
Email:*
Department:*
Why are you recommending this title?
Select reason:
 
 
 
 
 
Low-power HF Microelectronics: a unified approach — Recommend this title to your library

Thank you

Your recommendation has been sent to your librarian.

This chapter introduces a new method for the analysis and optimisation of reliability as an integrated part of the design process of electronic circuits and systems. It bases itself on the analysis of the susceptibility of failure mechanisms in components as a function of the combinations of external stress factors (stressor-sets). The chapter describes the background of stressor-susceptibility analysis, the need for this analysis and the way this method is used for high-level design and optimisation of electronic circuits. The theory is illustrated using the example of secondary breakdown in a (power) bipolar semiconductor, which can be applied, for instance, in 'smart power' designs. The methodology introduced can also be applied in systems of non-electronic and/or mixed nature.

Inspec keywords: power bipolar transistors; failure analysis; semiconductor device reliability

Other keywords: stressor-susceptibility analysis; external stress factors; electronic circuit reliability; electronic circuit design; failure mechanisms; power bipolar semiconductor; secondary breakdown

Subjects: Bipolar transistors

Preview this chapter:
Zoom in
Zoomout

Robust design and reliability analysis, Page 1 of 2

| /docserver/preview/fulltext/books/cs/pbcs008e/PBCS008E_ch11-1.gif /docserver/preview/fulltext/books/cs/pbcs008e/PBCS008E_ch11-2.gif

Related content

content/books/10.1049/pbcs008e_ch11
pub_keyword,iet_inspecKeyword,pub_concept
6
6
Loading
This is a required field
Please enter a valid email address