Inspec keywords: scanning electron microscopy; atomic force microscopy; quenching (thermal); elemental semiconductors; electroluminescence; electric sensing devices; porous semiconductors; silicon

Other keywords: electroluminescence; chemically modified surface; neutral electrolyte contact; EL quenching; polysterylsulphonate; Si; SEM; porous silicon; sensing applications; anodic polarisation; protein bovine serum albumin; phenomenological model; AFM; polyallylamine

Subjects: Electrical properties of elemental semiconductors (thin films, low-dimensional and nanoscale structures); Luminescent materials; Electroluminescence (condensed matter); Elemental semiconductors; Sensing devices and transducers