Inspec keywords: oscillators; chaos generators; CMOS integrated circuits; random number generation

Other keywords: NIST-800-22 tests; DIEHARD random number tests; CMOS IC realisation; binary data; random number generation; size 0.35 mum; integrated cross-coupled LC chaos oscillator; FIPS-140-2 tests

Subjects: CMOS integrated circuits; Digital arithmetic methods; Chaotic behaviour in circuits; Oscillators