Inspec keywords: nanoelectronics; molecular electronics; resistors; nanoparticles; reliability; probability; SPICE
Other keywords: probabilistic model; model representation; transient error; negative differential resistor; nanocell device reliability analysis; self-assembled monolayer; nanoparticles; extended continuous time birth-death model; PERL; MATLAB; HSPICE model
Subjects: Other topics in statistics; Computer-aided circuit analysis and design; Electronic engineering computing; Other topics in statistics; Reliability; Molecular electronics