Inspec keywords: atomic force microscopy; cantilevers; force sensors; nanofabrication; elastic constants; intermolecular forces; scanning tunnelling microscopy; surface conductivity; elastic deformation

Other keywords: tunnelling current generation; electrostatic attraction; AFM force sensing; noncontact fashion; intermolecular forces; electrical principles; insulating parts; comprehensive model; elastic contact deformation; STM; tip-based nanofabrication applications; optimal bias voltage; heterogeneous surface; potential resolution reduction; conductive parts; STM operation; snap-contact distances; metal-coated probes; scanning tunnelling microscope operation; conductive atomic force microscope probes; cantilever

Subjects: Elasticity, elastic constants; Deformation and plasticity; Surface conductivity and carrier phenomena; Solid surface structure; Scanning probe microscopy and related techniques; Elasticity and anelasticity