Inspec keywords: VLSI; data reduction; regression analysis; neural nets; circuit simulation; feature extraction; learning (artificial intelligence); integrated circuit noise; integrated circuit testing; support vector machines; least squares approximations

Other keywords: PATH; circuit simulation tools; PSN; leon3mp benchmark circuit; least-square boosting; timing-aware feature; LSBoost; SVR; flip-flop transition in window; support vector regression; power supply noise; feature extractions; switching activity in window; very large scale integration chip testing; yield loss; SAW; PSN-aware circuit test timing prediction; FFTW; IOT method; machine learning; neural network; physical-aware features; raw data dimension reduction; IR drop; terminal FF transition of long paths; circuit timing simulation; input-output transition

Subjects: Interpolation and function approximation (numerical analysis); Other topics in statistics; Semiconductor integrated circuit design, layout, modelling and testing; Computer-aided circuit analysis and design; Electronic engineering computing; Other topics in statistics; Interpolation and function approximation (numerical analysis); Neural computing techniques; Knowledge engineering techniques