Inspec keywords: radar equipment; life testing; leakage currents; semiconductor device testing; MOSFET; semiconductor device reliability; hot electron transistors

Other keywords: pulsed-RF life testing; hot electron; power laterally diffused-N-MOSFET device; frequency 2.2 GHz; charge trapping; size 0.8 mum; voltage 65 V; leakage current augmentation; size 0.065 mum; reliability; ATLAS-SILVACO simulation; transconductance; Miller capacitance; S-parameters evaluation; power 10 W; radar application; metal-oxide-semiconductor field-effect transistor

Subjects: Reliability; Insulated gate field effect transistors; Semiconductor device modelling, equivalent circuits, design and testing; Radar equipment, systems and applications; Bipolar transistors