Inspec keywords: asynchronous machines; SRAM chips; machine control; CMOS integrated circuits; low-power electronics; control engineering computing; integrated circuit design

Other keywords: metal–oxide–semiconductor process; random-access memory cell; ingle-ended 8T bit-cell; ultra-low voltage; bit-interleaved ultra-low voltage operation; asynchronous dual word-line control; single bit-line 8T SRAM cell; dual word-line control; read stability; write-ability; half-select stability

Subjects: Semiconductor storage; CMOS integrated circuits; Control engineering computing; Power system control; Memory circuits; Asynchronous machines; Control of electric power systems; Digital circuit design, modelling and testing