Inspec keywords: thin film devices; indium compounds; gallium compounds; alumina; wide band gap semiconductors; III-V semiconductors; solar cells; atomic layer deposition; carrier lifetime; passivation

Other keywords: carrier lifetime measurement; current-voltage characteristics; multilayer solar cell; surface electrical stability; efficiency 1.31 percent; efficiency 84 percent; surface passivation; surface carrier recombination rate; InGaN-GaN-Al2O3; atomic-layer deposited passivation film; ALD; efficiency 99 percent

Subjects: Solar cells and arrays; Photoelectric conversion; solar cells and arrays; Chemical vapour deposition; Surface treatment (semiconductor technology); Chemical vapour deposition; Corrosion, oxidation, etching, and other surface treatments