Inspec keywords: memristors; logic testing; logic design; design for testability; resistive RAM

Other keywords: 1T1R crossbar; memristor parametric variation; design-for-testability method; March MOM; one-transistor one-memristor crossbar; RRAM architecture; logic operation; March C*-1T1R test algorithm; pass-fail fault dictionary; large-size crossbar; parallel test algorithm; area overhead

Subjects: Digital storage; Memory circuits; Resistors; Digital circuit design, modelling and testing; Logic design methods